TY  - CHAP
AU  - Leonid I. Goray
ED  - Chandra Shakher Pathak
ED  - Samir Kumar
Y1  - 2021-04-26
PY  - 2021
T1  - Diffraction Grating Groove Metrology Using AFM & STM
N2  - This book contains chapters that describe advanced atomic force microscopy (AFM) modes and Raman spectroscopy. It also provides an in-depth understanding of advanced AFM modes and Raman spectroscopy for characterizing various materials. This volume is a useful resource for a wide range of readers, including scientists, engineers, graduate students, postdoctoral fellows, and scientific professionals working in specialized fields such as AFM, photovoltaics, 2D materials, carbon nanotubes, nanomaterials, and Raman spectroscopy.
BT  - Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization
SP  - Ch. 3
UR  - https://doi.org/10.5772/intechopen.97257
DO  - 10.5772/intechopen.97257
SN  - 978-1-83968-230-8
PB  - IntechOpen
CY  - Rijeka
Y2  - 2024-04-20
ER  -