TY  - CHAP
AU  - Marco Coïsson
AU  - Gabriele Barrera
AU  - Federica Celegato
AU  - Paola Tiberto
ED  - Chandra Shakher Pathak
ED  - Samir Kumar
Y1  - 2021-04-15
PY  - 2021
T1  - Nanomaterials Characterisation through Magnetic Field Dependent AFM
N2  - This book contains chapters that describe advanced atomic force microscopy (AFM) modes and Raman spectroscopy. It also provides an in-depth understanding of advanced AFM modes and Raman spectroscopy for characterizing various materials. This volume is a useful resource for a wide range of readers, including scientists, engineers, graduate students, postdoctoral fellows, and scientific professionals working in specialized fields such as AFM, photovoltaics, 2D materials, carbon nanotubes, nanomaterials, and Raman spectroscopy.
BT  - Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization
SP  - Ch. 2
UR  - https://doi.org/10.5772/intechopen.97249
DO  - 10.5772/intechopen.97249
SN  - 978-1-83968-230-8
PB  - IntechOpen
CY  - Rijeka
Y2  - 2024-04-26
ER  -