TY  - CHAP
AU  - Chun-Yu Lin
ED  - Steven H. Voldman
Y1  - 2019-04-09
PY  - 2019
T1  - Low-C ESD Protection Design in CMOS Technology
N2  - As we enter the nanoelectronics era, electrostatic discharge (ESD) phenomena is an important issue for everything from micro-electronics to nanostructures. This book provides insight into the operation and design of micro-gaps and nanogenerators with chapters on low capacitance ESD design in advanced technologies, electrical breakdown in micro-gaps, nanogenerators from ESD, and theoretical prediction and optimization of triboelectric nanogenerators. The information contained herein will prove useful for for engineers and scientists that have an interest in ESD physics and design.
BT  - Electrostatic Discharge
SP  - Ch. 2
UR  - https://doi.org/10.5772/intechopen.85594
DO  - 10.5772/intechopen.85594
SN  - 978-1-78984-897-7
PB  - IntechOpen
CY  - Rijeka
Y2  - 2024-04-19
ER  -