TY  - CHAP
AU  - Mouna Chetibi-Riah
AU  - Mohamed Masmoudi
AU  - Hichame Maanane
AU  - Jérôme Marcon
AU  - Karine Mourgues
AU  - Mohamed Ketata
AU  - Philippe Eudeline
ED  - Kenichi Takahata
Y1  - 2009-12-01
PY  - 2009
T1  - Accurate LDMOS Model Extraction Using DC, CV and Small Signal S Parameters Measurements for Reliability Issues
N2  - This book discusses key aspects of MEMS technology areas, organized in twenty-seven chapters that present the latest research developments in micro electronic and mechanical systems. The book addresses a wide range of fundamental and practical issues related to MEMS, advanced metal-oxide-semiconductor (MOS) and complementary MOS (CMOS) devices, SoC technology, integrated circuit testing and verification, and other important topics in the field. ?Several chapters cover state-of-the-art microfabrication techniques and materials as enabling technologies for the microsystems. Reliability issues concerning both electronic and mechanical aspects of these devices and systems are also addressed in various chapters.
BT  - Micro Electronic and Mechanical Systems
SP  - Ch. 16
UR  - https://doi.org/10.5772/7015
DO  - 10.5772/7015
SN  - 
PB  - IntechOpen
CY  - Rijeka
Y2  - 2024-04-26
ER  -