TY  - CHAP
AU  - Tomasz Tański
AU  - Bogusław Ziębowicz
AU  - Paweł Jarka
AU  - Marcin
Staszuk
ED  - Tomasz Tański
ED  - Marcin Staszuk
ED  - Bogusław Ziębowicz
Y1  - 2018-11-05
PY  - 2018
T1  - Introductory Chapter: Why Atomic Force Microscopy (AFM) is One of the Leading Methods of Surface Morphology Research of all Engineering Material Groups
N2  - Atomic force microscopy is a surface analytical technique used in air, liquids or a vacuum to generate very high-resolution topographic images of a surface, down to atomic resolution. This book is not only for students but also for professional engineers who are working in the industry as well as specialists. This book aims to provide the reader with a comprehensive overview of the new trends, research results and development of atomic force microscopy. The chapters for this book have been written by respected and well-known researchers and specialists from different countries. We hope that after studying this book, you will have objective knowledge about the possible uses of atomic force microscopy in many scientific aspects of our civilisation.
BT  - Atomic-force Microscopy and Its Applications
SP  - Ch. 1
UR  - https://doi.org/10.5772/intechopen.80446
DO  - 10.5772/intechopen.80446
SN  - 978-1-78985-170-0
PB  - IntechOpen
CY  - Rijeka
Y2  - 2024-04-23
ER  -