TY  - CHAP
AU  - Tatiana Evgenievna Sukhanova
AU  - Tatyana A. Kuznetsova
AU  - Vasilina A.
Lapitskaya
AU  - Tatiana I. Zubar
AU  - Sergei A. Chizhik
AU  - Milana E.
Vylegzhanina
AU  - Aleksandr A. Kutin
AU  - Andrey L. Didenko
AU  - Valentin
M. Svetlichnyi
ED  - Tomasz Tański
ED  - Marcin Staszuk
ED  - Bogusław Ziębowicz
Y1  - 2018-11-05
PY  - 2018
T1  - Characterization of Multiblock (Segmented) Copolyurethane- Imides and Nanocomposites Based Thereof Using AFM, Nanotribology, and Nanoindentation Methods
N2  - Atomic force microscopy is a surface analytical technique used in air, liquids or a vacuum to generate very high-resolution topographic images of a surface, down to atomic resolution. This book is not only for students but also for professional engineers who are working in the industry as well as specialists. This book aims to provide the reader with a comprehensive overview of the new trends, research results and development of atomic force microscopy. The chapters for this book have been written by respected and well-known researchers and specialists from different countries. We hope that after studying this book, you will have objective knowledge about the possible uses of atomic force microscopy in many scientific aspects of our civilisation.
BT  - Atomic-force Microscopy and Its Applications
SP  - Ch. 5
UR  - https://doi.org/10.5772/intechopen.78625
DO  - 10.5772/intechopen.78625
SN  - 978-1-78985-170-0
PB  - IntechOpen
CY  - Rijeka
Y2  - 2024-04-24
ER  -