TY  - CHAP
AU  - João P. Braga
AU  - Guilherme R. De Lima
AU  - Giovani Gozzi
AU  - Lucas
Fugikawa Santos
ED  - Dhanasekaran Vikraman
ED  - Hyun-Seok Kim
Y1  - 2018-11-05
PY  - 2018
T1  - Electrical Characterization of Thin-Film Transistors Based on Solution-Processed Metal Oxides
N2  - In recent years, research on microelectronics has been specifically focused on the proposition of efficient alternative methodologies and materials to fabricate feasible integrated circuits. This book provides a general background of thin film transistors and their simulations and constructions. The contents of the book are broadly classified into two topics: design and simulation of FETs and construction of FETs. All the authors anticipate that the provided chapters will act as a single source of reference for the design, simulation and construction of FETs. This edited book will help microelectronics researchers with their endeavors and would be a great addition to the realm of semiconductor physics.
BT  - Design, Simulation and Construction of Field Effect Transistors
SP  - Ch. 8
UR  - https://doi.org/10.5772/intechopen.78221
DO  - 10.5772/intechopen.78221
SN  - 978-1-78923-417-6
PB  - IntechOpen
CY  - Rijeka
Y2  - 2024-04-18
ER  -