TY - CHAP AU - Jaime Vitola AU - Maribel Anaya Vejar AU - Diego Alexander Tibaduiza Burgos AU - Francesc Pozo ED - S. Ramakrishnan Y1 - 2016-12-14 PY - 2016 T1 - Data-Driven Methodologies for Structural Damage Detection Based on Machine Learning Applications N2 - Pattern recognition continued to be one of the important research fields in computer science and electrical engineering. Lots of new applications are emerging, and hence pattern analysis and synthesis become significant subfields in pattern recognition. This book is an edited volume and has six chapters arranged into two sections, namely, pattern recognition analysis and pattern recognition applications. This book will be useful for graduate students, researchers, and practicing engineers working in the field of machine vision and computer science and engineering. BT - Pattern Recognition SP - Ch. 6 UR - https://doi.org/10.5772/65867 DO - 10.5772/65867 SN - 978-953-51-2804-5 PB - IntechOpen CY - Rijeka Y2 - 2024-03-28 ER -