TY  - CHAP
AU  - Masashi Nojima
ED  - Khan Maaz
Y1  - 2015-09-02
PY  - 2015
T1  - Shave-Off Profiling for TEM Specimens
N2  - This book The Transmission Electron Microscope abundantly illustrates necessary insight and guidance of this powerful and versatile material characterization technique with complete figures and thorough explanations. The second edition of the book presents deep understanding of new techniques from introduction to advance levels, covering in-situ transmission electron microscopy, electron and focused ion beam microscopy, and biological diagnostic through TEM. The chapters cover all major aspects of transmission electron microscopy and their uses in material characterization with special emphasis on both the theoretical and experimental aspects of modern electron microscopy techniques. It is believed that this book will provide a solid foundation of electron microscopy to the students, scientists, and engineers working in the field of material science and condensed matter physics.
BT  - The Transmission Electron Microscope
SP  - Ch. 4
UR  - https://doi.org/10.5772/60682
DO  - 10.5772/60682
SN  - 
PB  - IntechOpen
CY  - Rijeka
Y2  - 2024-04-18
ER  -