TY  - CHAP
AU  - Z. Chen
AU  - L.W. Su
AU  - J.Y. Shi
AU  - X.L. Wang
AU  - C.L. Tang
AU  - P. Gao
ED  - Victor Bellitto
Y1  - 2012-03-23
PY  - 2012
T1  - AFM Application in III-Nitride Materials and Devices
N2  - With the advent of the atomic force microscope (AFM) came an extremely valuable analytical resource and technique useful for the qualitative and quantitative surface analysis with sub-nanometer resolution. In addition, samples studied with an AFM do not require any special pretreatments that may alter or damage the sample and permits a three dimensional investigation of the surface. This book presents a collection of current research from scientists throughout the world that employ atomic force microscopy in their investigations. The technique has become widely accepted and used in obtaining valuable data in a wide variety of fields.  It is impressive to see how, in a short time period since its development in 1986, it has proliferated and found many uses throughout manufacturing, research and development.
BT  - Atomic Force Microscopy
SP  - Ch. 9
UR  - https://doi.org/10.5772/37527
DO  - 10.5772/37527
SN  - 
PB  - IntechOpen
CY  - Rijeka
Y2  - 2024-04-25
ER  -