TY  - CHAP
AU  - Coskun Aydiner
AU  - Semra Topcu
AU  - Caner Tortop
AU  - Ferihan Kuvvet
AU  - Didem Ekinci
AU  - Nadir Dizge
AU  - Bulent Keskinler
ED  - Viacheslav Kazmiruk
Y1  - 2012-03-09
PY  - 2012
T1  - Interrelated Analysis of Performance and Fouling Behaviors in Forward Osmosis by Ex-Situ Membrane Characterizations
N2  - Today, an individual would be hard-pressed to find any science field that does not employ methods and instruments based on the use of fine focused electron and ion beams. Well instrumented and supplemented with advanced methods and techniques, SEMs provide possibilities not only of surface imaging but quantitative measurement of object topologies, local electrophysical characteristics of semiconductor structures and performing elemental analysis. Moreover, a fine focused e-beam is widely used for the creation of micro and nanostructures. The book’s approach covers both theoretical and practical issues related to scanning electron microscopy. The book has 41 chapters, divided into six sections: Instrumentation, Methodology, Biology, Medicine, Material Science, Nanostructured Materials for Electronic Industry, Thin Films, Membranes, Ceramic, Geoscience, and Mineralogy. Each chapter, written by different authors, is a complete work which presupposes that readers have some background knowledge on the subject.
BT  - Scanning Electron Microscopy
SP  - Ch. 31
UR  - https://doi.org/10.5772/36668
DO  - 10.5772/36668
SN  - 
PB  - IntechOpen
CY  - Rijeka
Y2  - 2024-04-25
ER  -