TY - CHAP AU - Mohamed-Tahar Chentir AU - Hitoshi Morioka AU - Yoshitaka Ehara AU - Keisuke Saito AU - Shintaro Yokoyama AU - Takahiro Oikawa AU - Hiroshi Funakubo ED - Mickaƫl Lallart Y1 - 2011-08-23 PY - 2011 T1 - Changes of Crystal Structure and Electrical Properties with Film Thickness and Zr/(Zr+Ti) Ratio for Epitaxial Pb(Zr,Ti)O3 Films Grown on (100)cSrRuO3//(100)SrTiO3 Substrates by Metalorganic Chemical Vapor Deposition N2 - Ferroelectric materials have been and still are widely used in many applications, that have moved from sonar towards breakthrough technologies such as memories or optical devices. This book is a part of a four volume collection (covering material aspects, physical effects, characterization and modeling, and applications) and focuses on the characterization of ferroelectric materials, including structural, electrical and multiphysic aspects, as well as innovative techniques for modeling and predicting the performance of these devices using phenomenological approaches and nonlinear methods. Hence, the aim of this book is to provide an up-to-date review of recent scientific findings and recent advances in the field of ferroelectric system characterization and modeling, allowing a deep understanding of ferroelectricity. BT - Ferroelectrics SP - Ch. 12 UR - https://doi.org/10.5772/17740 DO - 10.5772/17740 SN - PB - IntechOpen CY - Rijeka Y2 - 2024-03-28 ER -