TY  - CHAP
AU  - Josep Canet-Ferrer
AU  - Juan P. Martínez-Pastor
ED  - Mickaël Lallart
Y1  - 2011-08-23
PY  - 2011
T1  - Near-Field Scanning Optical Microscopy Applied to the Study of Ferroelectric Materials
N2  - Ferroelectric materials have been and still are widely used in many applications, that have moved from sonar towards breakthrough technologies such as memories or optical devices. This book is a part of a four volume collection (covering material aspects, physical effects, characterization and modeling, and applications) and focuses on the characterization of ferroelectric materials, including structural, electrical and multiphysic aspects, as well as innovative techniques for modeling and predicting the performance of these devices using phenomenological approaches and nonlinear methods. Hence, the aim of this book is to provide an up-to-date review of recent scientific findings and recent advances in the field of ferroelectric system characterization and modeling, allowing a deep understanding of ferroelectricity.
BT  - Ferroelectrics
SP  - Ch. 2
UR  - https://doi.org/10.5772/16664
DO  - 10.5772/16664
SN  - 
PB  - IntechOpen
CY  - Rijeka
Y2  - 2024-04-19
ER  -