@incollection{Tański18,
author = {Tomasz Tański and Bogusław Ziębowicz and Paweł Jarka and Marcin
Staszuk},
title = {Introductory Chapter: Why Atomic Force Microscopy (AFM) is One of the Leading Methods of Surface Morphology Research of all Engineering Material Groups},
booktitle = {Atomic-force Microscopy and Its Applications},
publisher = {IntechOpen},
address = {Rijeka},
year = {2018},
editor = {Tomasz Tański and Marcin Staszuk and Bogusław Ziębowicz},
chapter = {1},
doi = {10.5772/intechopen.80446},
url = {https://doi.org/10.5772/intechopen.80446}
}