@incollection{Gong18,
author = {Dian Lei and Xiao Gong},
title = {Ge0.83Sn0.17 P-Channel Metal-Oxide-Semiconductor Field- Effect Transistors: Impact of Sulfur Passivation on Gate Stack Quality},
booktitle = {Design, Simulation and Construction of Field Effect Transistors},
publisher = {IntechOpen},
address = {Rijeka},
year = {2018},
editor = {Dhanasekaran Vikraman and Hyun-Seok Kim},
chapter = {6},
doi = {10.5772/intechopen.74532},
url = {https://doi.org/10.5772/intechopen.74532}
}