@incollection{Stanimirović17,
author = {Ivanka Stanimirović},
title = {Thick‐Film Resistor Failure Analysis Based on Low‐Frequency Noise Measurements},
booktitle = {Failure Analysis and Prevention},
publisher = {IntechOpen},
address = {Rijeka},
year = {2017},
editor = {Aidy Ali},
chapter = {5},
doi = {10.5772/intechopen.69442},
url = {https://doi.org/10.5772/intechopen.69442}
}