@incollection{Stanimirović17,
author = {Zdravko Stanimirović},
title = {Low‐Frequency Noise and Resistance as Reliability Indicators of Mechanically and Electrically Strained Thick‐Film Resistors},
booktitle = {System Reliability},
publisher = {IntechOpen},
address = {Rijeka},
year = {2017},
editor = {Constantin Volosencu},
chapter = {12},
doi = {10.5772/intechopen.69441},
url = {https://doi.org/10.5772/intechopen.69441}
}