@incollection{Lee17,
author = {Chang Yeol Lee},
title = {Transistor Degradations in Very Large-Scale-Integrated CMOS Technologies},
booktitle = {Very-Large-Scale Integration},
publisher = {IntechOpen},
address = {Rijeka},
year = {2017},
editor = {Kim Ho Yeap and Humaira Nisar},
chapter = {2},
doi = {10.5772/intechopen.68825},
url = {https://doi.org/10.5772/intechopen.68825}
}