@incollection{Yoshida17,
author = {Sanichiro Yoshida and David R. Didie and Jong-Sung Kim and Ik-Keun Park},
title = {Application of Optical Interferometry for Characterization of Thin-Film Adhesion},
booktitle = {Optical Interferometry},
publisher = {IntechOpen},
address = {Rijeka},
year = {2017},
editor = {Alexander A. Banishev and Mithun Bhowmick and Jue Wang},
chapter = {4},
doi = {10.5772/66205},
url = {https://doi.org/10.5772/66205}
}