@incollection{Hirano12,
author = {Takuichi Hirano and Kenichi Okada and Jiro Hirokawa and Makoto Ando},
title = {Accuracy Investigation of De-Embedding Techniques Based on Electromagnetic Simulation for On-Wafer RF Measurements},
booktitle = {Numerical Simulation},
publisher = {IntechOpen},
address = {Rijeka},
year = {2012},
editor = {Mykhaylo Andriychuk},
chapter = {11},
doi = {10.5772/48431},
url = {https://doi.org/10.5772/48431}
}