@incollection{Christien12,
author = {Frédéric Christien and Edouard Ferchaud and Pawel Nowakowski and Marion Allart},
title = {The Use of Electron Probe MicroAnalysis to Determine the Thickness of Thin Films in Materials Science},
booktitle = {X-Ray Spectroscopy},
publisher = {IntechOpen},
address = {Rijeka},
year = {2012},
editor = {Shatendra K. Sharma},
chapter = {6},
doi = {10.5772/28877},
url = {https://doi.org/10.5772/28877}
}