Open access peer-reviewed chapter

High‐Resolution X‐Ray Diffraction of III–V Semiconductor Thin Films

By Hédi Fitouri, Mohamed Mourad Habchi and Ahmed Rebey

Submitted: March 11th 2016Reviewed: August 29th 2016Published: January 25th 2017

DOI: 10.5772/65404

Downloaded: 658

© 2017 The Author(s). Licensee IntechOpen. This chapter is distributed under the terms of the Creative Commons Attribution 3.0 License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

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Hédi Fitouri, Mohamed Mourad Habchi and Ahmed Rebey (January 25th 2017). High‐Resolution X‐Ray Diffraction of III–V Semiconductor Thin Films, X-ray Scattering Alicia Esther Ares, IntechOpen, DOI: 10.5772/65404. Available from:

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