InTechOpen uses cookies to offer you the best online experience. By continuing to use our site, you agree to our Privacy Policy.

Engineering » Industrial Engineering and Management » "Wide Spectra of Quality Control", book edited by Isin Akyar, ISBN 978-953-307-683-6, Published: November 9, 2011 under CC BY 3.0 license. © The Author(s).

Chapter 26

Material Characterization and Failure Analysis for Microelectronics Assembly Processes

By Chien-Yi Huang, Ming-Shu Li, Shan-Yu Huang, Cheng-I Chang and Min-Hui Huang
DOI: 10.5772/23532