Open access peer-reviewed chapter

Transistor Degradations in Very Large-Scale-Integrated CMOS Technologies

By Chang Yeol Lee

Submitted: December 13th 2016Reviewed: March 27th 2017Published: February 28th 2018

DOI: 10.5772/intechopen.68825

Downloaded: 186

© 2018 The Author(s). Licensee IntechOpen. This chapter is distributed under the terms of the Creative Commons Attribution 3.0 License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

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Chang Yeol Lee (February 28th 2018). Transistor Degradations in Very Large-Scale-Integrated CMOS Technologies, Very-Large-Scale Integration Kim Ho Yeap and Humaira Nisar, IntechOpen, DOI: 10.5772/intechopen.68825. Available from:

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