Open access peer-reviewed chapter

Transmission Electron Microscopy to Study Gallium Nitride Transistors Grown on Sapphire and Silicon Substrates

By S. Lawrence Selvaraj and Takashi Egawa

Submitted: May 17th 2011Reviewed: October 7th 2011Published: April 4th 2012

DOI: 10.5772/35876

Downloaded: 3742

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S. Lawrence Selvaraj and Takashi Egawa (April 4th 2012). Transmission Electron Microscopy to Study Gallium Nitride Transistors Grown on Sapphire and Silicon Substrates, The Transmission Electron Microscope, Khan Maaz, IntechOpen, DOI: 10.5772/35876. Available from:

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