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Low‐Frequency Noise and Resistance as Reliability Indicators of Mechanically and Electrically Strained Thick‐Film Resistors

By Zdravko Stanimirović

Submitted: December 2nd 2016Reviewed: April 25th 2017Published: December 20th 2017

DOI: 10.5772/intechopen.69441

Downloaded: 155

© 2017 The Author(s). Licensee IntechOpen. This chapter is distributed under the terms of the Creative Commons Attribution 3.0 License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

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Zdravko Stanimirović (December 20th 2017). Low‐Frequency Noise and Resistance as Reliability Indicators of Mechanically and Electrically Strained Thick‐Film Resistors, System Reliability Constantin Volosencu, IntechOpen, DOI: 10.5772/intechopen.69441. Available from:

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