Open access peer-reviewed chapter

Application of Nondestructive Measurement to Improve Soybean Quality by Near Infrared Reflectance Spectroscopy

By Jeong-Dong Lee, J. Grover Shannon and Myoung-Gun Choung

Submitted: June 18th 2010Reviewed: September 20th 2010Published: April 26th 2011

DOI: 10.5772/15842

Downloaded: 3358

© 2011 The Author(s). Licensee IntechOpen. This chapter is distributed under the terms of the Creative Commons Attribution-NonCommercial-ShareAlike-3.0 License, which permits use, distribution and reproduction for non-commercial purposes, provided the original is properly cited and derivative works building on this content are distributed under the same license.

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Jeong-Dong Lee, J. Grover Shannon and Myoung-Gun Choung (April 26th 2011). Application of Nondestructive Measurement to Improve Soybean Quality by Near Infrared Reflectance Spectroscopy, Soybean - Applications and Technology, Tzi-Bun Ng, IntechOpen, DOI: 10.5772/15842. Available from:

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