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Gage Repeatability and Reproducibility Methodologies Suitable for Complex Test Systems in Semi-Conductor Manufacturing

By Sandra Healy and Michael Wallace

Submitted: November 9th 2010Published: July 14th 2011

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© 2011 The Author(s). Licensee IntechOpen. This chapter is distributed under the terms of the Creative Commons Attribution-NonCommercial-ShareAlike-3.0 License, which permits use, distribution and reproduction for non-commercial purposes, provided the original is properly cited and derivative works building on this content are distributed under the same license.

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Sandra Healy and Michael Wallace (July 14th 2011). Gage Repeatability and Reproducibility Methodologies Suitable for Complex Test Systems in Semi-Conductor Manufacturing, Six Sigma Abdurrahman Coskun, IntechOpen, DOI: null. Available from:

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