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Chemistry » Electrochemistry » "Scanning Probe Microscopy - Physical Property Characterization at Nanoscale", book edited by Vijay Nalladega, ISBN 978-953-51-0576-3, Published: April 27, 2012 under CC BY 3.0 license. © The Author(s).

Chapter 2

Tuning Fork Scanning Probe Microscopes - Applications for the Nano-Analysis of the Material Surface and Local Physico-Mechanical Properties

By Vo Thanh Tung, S.A. Chizhik, Tran Xuan Hoai, Nguyen Trong Tinh and V.V. Chikunov
DOI: 10.5772/36187