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Chemistry » Electrochemistry » "Scanning Probe Microscopy - Physical Property Characterization at Nanoscale", book edited by Vijay Nalladega, ISBN 978-953-51-0576-3, Published: April 27, 2012 under CC BY 3.0 license. © The Author(s).

Chapter 1

Multiple Material Property Characterization Using Induced Currents and Atomic Force Microscopy

By Vijay Nalladega, Shamachary Sathish, Kumar V. Jata and Mark P. Blodgett
DOI: 10.5772/35594