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Chemistry » Electrochemistry » "Scanning Probe Microscopy - Physical Property Characterization at Nanoscale", book edited by Vijay Nalladega, ISBN 978-953-51-0576-3, Published: April 27, 2012 under CC BY 3.0 license. © The Author(s).

Chapter 9

Estimation of Grain Boundary Sliding During Ambient-Temperature Creep in Hexagonal Close-Packed Metals Using Atomic Force Microscope

By Tetsuya Matsunaga and Eiichi Sato
DOI: 10.5772/35640