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Materials Science » Metals and Nonmetals » "Physics and Technology of Silicon Carbide Devices", book edited by Yasuto Hijikata, ISBN 978-953-51-0917-4, Published: October 16, 2012 under CC BY 3.0 license. © The Author(s).

Chapter 2

Characterization of Defects Evolution in Bulk SiC by Synchrotron X-Ray Imaging

By T. S. Argunova, M. Yu. Gutkin, J. H. Je, V. G. Kohn and E. N. Mokhov
DOI: 10.5772/52058