Open access peer-reviewed chapter

Image Artifacts by Charge Pocket in Floating Diffusion Region on CMOS Image Sensors

By Sang-Gi Lee, Jong-Min Kim, Sang-Hoon Bae, Jin-Won Park and Yoon-Jong Lee

Submitted: November 9th 2010Reviewed: April 6th 2011Published: July 29th 2011

DOI: 10.5772/20526

Downloaded: 3565

© 2011 The Author(s). Licensee IntechOpen. This chapter is distributed under the terms of the Creative Commons Attribution-NonCommercial-ShareAlike-3.0 License, which permits use, distribution and reproduction for non-commercial purposes, provided the original is properly cited and derivative works building on this content are distributed under the same license.

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Sang-Gi Lee, Jong-Min Kim, Sang-Hoon Bae, Jin-Won Park and Yoon-Jong Lee (July 29th 2011). Image Artifacts by Charge Pocket in Floating Diffusion Region on CMOS Image Sensors, Photodiodes Jeong Woo Park, IntechOpen, DOI: 10.5772/20526. Available from:

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