Open access

In-Situ Analysis of Optoelectronic Properties of Semiconductor Nanostructures and Defects in Transmission Electron Microscopes

Written By

Yutaka Ohno, Ichiro Yonenega and Seiji Takeda

Submitted: 31 May 2010 Published: 19 April 2011

DOI: 10.5772/14813

From the Edited Volume

Optoelectronic Devices and Properties

Edited by Oleg Sergiyenko

Chapter metrics overview

2,309 Chapter Downloads

View Full Metrics

Written By

Yutaka Ohno, Ichiro Yonenega and Seiji Takeda

Submitted: 31 May 2010 Published: 19 April 2011