Open access peer-reviewed chapter

Nano-Scale Measurements of Dopants and Electronic Impurities in Individual Silicon Nanowires Using Kelvin Probe Force Microscopy

By Elad Koren, Jonathan E. Allen, Uri Givan, Noel Berkovitch, Eric R. Hemesath, Lincoln J. Lauhon and Yossi Rosenwaks

Submitted: November 3rd 2010Reviewed: March 28th 2011Published: July 18th 2011

DOI: 10.5772/19333

Downloaded: 3355

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Elad Koren, Jonathan E. Allen, Uri Givan, Noel Berkovitch, Eric R. Hemesath, Lincoln J. Lauhon and Yossi Rosenwaks (July 18th 2011). Nano-Scale Measurements of Dopants and Electronic Impurities in Individual Silicon Nanowires Using Kelvin Probe Force Microscopy, Nanowires - Implementations and Applications, Abbass Hashim, IntechOpen, DOI: 10.5772/19333. Available from:

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