Open access peer-reviewed chapter

Automated MOS Transistor Gamma Degradation Measurements Based on LabVIEW Environment

By Slimane Oussalah and Boualem Djezzar

Submitted: May 4th 2010Published: January 21st 2011

DOI: 10.5772/13538

Downloaded: 2551

© 2011 The Author(s). Licensee IntechOpen. This chapter is distributed under the terms of the Creative Commons Attribution-NonCommercial-ShareAlike-3.0 License, which permits use, distribution and reproduction for non-commercial purposes, provided the original is properly cited and derivative works building on this content are distributed under the same license.

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Slimane Oussalah and Boualem Djezzar (January 21st 2011). Automated MOS Transistor Gamma Degradation Measurements Based on LabVIEW Environment, Modeling, Programming and Simulations Using LabVIEW™ Software Riccardo De Asmundis, IntechOpen, DOI: 10.5772/13538. Available from:

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