Open access peer-reviewed chapter

Advanced Scanning Tunneling Microscopy for Nanoscale Analysis of Semiconductor Devices

By Leonid Bolotov and Toshihiko Kanayama

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Published: September 21st 2016

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Leonid Bolotov and Toshihiko Kanayama (September 21st 2016). Advanced Scanning Tunneling Microscopy for Nanoscale Analysis of Semiconductor Devices, Microscopy and Analysis Stefan G. Stanciu, IntechOpen, DOI: 10.5772/62552. Available from:

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