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Microtopography and Thickness Measurement with Digital Holographic Microscopy Highlighting and Its Tomographic Capacity

By Miguel León-Rodríguez, Juan A. Rayas-Alvarez, Amalia Martínez- García and Raúl R. Cordero

Submitted: May 28th 2016Reviewed: November 7th 2016Published: March 22nd 2017

DOI: 10.5772/66750

Downloaded: 388

© 2017 The Author(s). Licensee IntechOpen. This chapter is distributed under the terms of the Creative Commons Attribution 3.0 License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

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Miguel León-Rodríguez, Juan A. Rayas-Alvarez, Amalia Martínez- García and Raúl R. Cordero (March 22nd 2017). Microtopography and Thickness Measurement with Digital Holographic Microscopy Highlighting and Its Tomographic Capacity, Holographic Materials and Optical Systems Izabela Naydenova, IntechOpen, DOI: 10.5772/66750. Available from:

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