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Description of Topography of Surfaces and Thin Films with the use Fourier Transformation, Obtained from Non-Standard Optical Measurements

By Janusz Jaglarz

Submitted: June 26th 2010Reviewed: December 1st 2010Published: April 1st 2011

DOI: 10.5772/16037

Downloaded: 4152

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Janusz Jaglarz (April 1st 2011). Description of Topography of Surfaces and Thin Films with the use Fourier Transformation, Obtained from Non-Standard Optical Measurements, Fourier Transforms - New Analytical Approaches and FTIR Strategies, Goran Nikolic, IntechOpen, DOI: 10.5772/16037. Available from:

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