Energy-Dispersive Spectra (EDS) Analysis Data for BITWC ceramics
1. Introduction
This article represents a systematic review of the behaviour of B-site multi-element doping effect on electrical property of bismuth titanate ceramics. Bismuth titanate, Bi4Ti3O12 (BIT) is a potential candidate for high-temperature device applications due to their high dielectric constant, Curie temperature (
BIT is of interest in high-temperature piezoelectric sensors, because it remains ferroelectric up to 675 °C and offers relatively high piezoelectric property (Subbarao, 1961). However, the high leakage current and domain pinning due to defects in BIT have appeared as obstacles for further applications. The reasons for such problems are suggested due to the instability in the oxidation state of Ti ions and the volatile property of Bi during the sintering process (Nagata, 1999). Great efforts have been made to solve the high-leakage current, by incorporation of W, Nb or Ta dopants, as these can significantly decrease the conductivity in BIT (Hong, 2000; Markovec, 2001; Shulman, 1999; Takenaka, 1981; Villegas, 1999; Zhang, 2004). Unfortunately, the piezoelectric effect in the high Curie temperature BIT is relatively low, with coefficient values typically less than 20 pC N-1 found for both pure and modified Bi4Ti3O12. Thus, it is a challenge to seek a rational pathway to improve the electrical property of BIT ceramics.
We have reported in our publications, the effects of composition and crystal lattice structure upon microstructure, dielectric, piezoelectric and electrical properties of BIT, Bi4Ti3-xWxO12+x+0.2wt%Cr2O3 (BTWC), Bi4Ti3-2xNbxTaxO12 (BTNT) and Bi4Ti3-2xNbxTax-ySbyO12 (BTNTS) ceramics have been widely investigated (Hou et al, 2009, 2010 and 2011). The processing of as-synthesized BIT were optimized and the main parameters were determined, and confirmed that the piezoelectric coefficient (
2. W/Cr modified Bi4Ti3O12 ceramics
Bismuth titanate, Bi4Ti3O12 (BIT) is a potential candidate for high-temperature device applications due to their high Curie temperature (
It is noted that the studies concerning the effect of W+6 doping on electrical and sintering behavior have been reported earlier (Jardiel, 2006, 2008; Villegas, 2004). However reports on W/Cr doped BIT ceramics are scarce. We have made an attempt to optimize the W/Cr doping to yield enhanced piezoelectric and dielectric properties of BIT ceramics. The influence of W/Cr doping on the structural, sintering behavior, dielectric, electrical conductivity and piezoelectric properties of BIT ceramics is reported in this section.
Fig. 1 (A) shows the X-ray diffraction patterns of BITWC ceramics at room temperature. Diffraction data does not show any evidence of the formation of tungsten and chromium oxide or associated compounds that contain bismuth or titanium. Therefore, the BITWC ceramics maintains a layer structure similar to the perovskite BIT even under extensive modifications by W6+/Cr3+.
Evolution of XRD patterns associated with the peaks of (020)/(200) and (220)/(1115) of BITWC with different W/Cr content are shown in Fig. 1 (B). For sample with 0.025W/Cr, the (020) diffraction pattern at 2
Fig. 3 shows the SEM images of the polished and thermally etched surfaces of BITWC ceramics. It is observed that the average grain size decreased with W/Cr doping ranging from approximately 10 μm to 1 μm, which suggest that W/Cr control the growth of the plate-like grains. It is reported that WO3 influences the grain growth kinetics due to the slowing of grain boundary diffusion processes (Jardiel, 2008). The aspect ratio of the grains decreases with increase of W/Cr doping as shown in Fig. 3. This will lead to a better arrangement of the particles during the sintering processes and consequently to an enhanced densification of the ceramics. Table I shows the EDS analysis data of BITWC ceramics. When x ≤ 0.05, the experimentally observed atomic ratios agreed with the initial compositions signifies that the BITWC ceramics are single phase. This shows that the W6+/Cr3+ cations were incorporated into the layered perovskite structure and presumably occupied Ti4+ sites. While for x ≥ 0.075 compositions, EDS results were not in agreement with the initial theoretical atomic ratios. This indicates the presence of the secondary phases in the samples.
Element | BIT | x=0.025 | x=0.05 | x=0.075 | x=0.1 | x=0.15 |
Bi | 4.00 | 3.98 | 3.97 | 3.96 | 3.93 | 3.87 |
Ti | 2.99 | 2.98 | 2.94 | 2.91 | 2.86 | 2.81 |
W | 0 | 0.025 | 0.05 | 0.076 | 0.11 | 0.16 |
Cr | 0 | 0.4 | 0.4 | 0.39 | 0.4 | 0.37 |
O | 12.00 | 12.00 | 12.00 | 12.08 | 12.09 | 12.16 |
Fig. 4 (a) shows the variation of the real part of impedance (
Relaxation processes in many electric, magnetic, mechanical and other systems are governed by the Kohlrausch-Williams-Watts (KWW) law (Williams, 1970),
where τ is the relaxation time and 0 < β ≤ 1 is the parameter which indicates the deviation from Debye-type relaxation. The dielectric behaviour of the present ceramics is rationalized by invoking modified KWW function suggested by Bergman (Bergman, 2000). The imaginary part of the electric modulus (
where
Fig. 5 depicts the variation of relaxation frequency with an inverse of absolute temperature for the composition of x=0.025. The activation energy for electrical relaxation can be calculated using Arrhenius relation as:
where f
T (oC) | R1 (ohm) | CPE (1) [nF] | n1 | R2 (ohm) | CPE (2) [F] | n2 | R3 (ohm) |
450 | 1.98×105 | 1.26 | 0.88 | 1.14×105 | 3×10-6 | 0.60 | 6333 |
500 | 5.7×104 | 1.8 | 0.89 | 3.3×104 | 2×10-5 | 0.5 | 1300 |
550 | 2.2×104 | 1.66 | 0.89 | 1.5×104 | 1×10-5 | 0.41 | 268 |
600 | 1.1×104 | 1.2 | 0.9 | 7871 | 0.037 | 0.35 | 0.01 |
If we scale each
Figs. 7 depict complex impedance plots at 600 °C temperatures for x=0.025 samples. The complex impedance plots were resolved with two depressed semicircles corresponding to grain and grain boundaries. The impedance data for x=0.025 samples were fitted using superimposition of two Cole-Cole expressions as:
where R
experimental data. The capacitors in the equivalent circuit are universal capacitors
In order to study the relaxation mechanism for various compositions, the plots of
Dielectric constant and dielectric loss were calculated at various frequencies and temperatures (for the compositions under study) from the impedance data using the following relations:
where C
In order to further elucidate the transport mechanism in the present ceramics, the electrical conductivity at different temperatures is studied. Electrical conductivity can be calculated from the dielectric data as:
where
Where
To further investigate the conductivity for all the compositions, we have plotted frequency dependent (0.1Hz-3MHz) electrical conductivity for all the compositions under study at 600 °C temperature as shown in Fig. 12. It is interesting to note that electrical conductivity of x=0.025 sample decreases significantly as compared with that of undoped BIT ceramics. Consequently conductivity increases with further increase in W/Cr content. In BIT ceramics, hole compensation of bismuth vacancies promotes p-type electronic conductivity. Under charge neutrality restriction, when W6+ substitutes Ti4+, two positive charge centers at W site and two electrons will be created. These electrons neutralize the influence of the holes. The conductivity decreases with donor doping to a minimum value where the concentration of electron holes matches the electron concentration (p=n). With a further increase in the donor (W+6) concentration the conductivity becomes n-type and starts to increase again. The minimum conductivity appears at a lower W/Cr content doped BIT ceramics (x=0.025). Presence of secondary phase in higher concentration doped (x>0.075) ceramics can also play crucial role in the conductivity behaviour (Hyatt et al. 2005; Jardiel et al. 2006). It is reported that the Bi6Ti3WO18 ceramics have higher conductivity than Bi4Ti3O12 ceramics which results higher conductivity associated with the ceramics of higher concentration (x > 0.075). However, it is reported in the literature that the conductivity decreases up to concentration of x = 0.08 and consequently increases in sluggish manner with increase in the W doping (Jardiel, 2008). The reported value of dc conductivity at 600 °C is 3.2 × 10-5 (ohm cm)-1 for the W doping concentration of 0.05 (Jardiel, 2008). While in the present investigations, the value of dc conductivity is found to be 2.38 × 10-6 (ohm cm)-1 for the x=0.05 W/Cr doping at 600 °C. This difference in the value of electrical conductivity can be attributed to microscopic heterogeneity and random arrangement of cations in the structure due to the presence of Cr ions along with W and Ti ions at B-site. The interaction between the cations controls the conduction and dielectric mechanisms of the present ceramics. A defect chemistry expression for W doping can be written as
It shows that the oxygen vacancies are reduced upon the substitution of donor W6+ ion for Ti4+. Hence, it is reasonable to believe that the conductivity in BIT ceramics is suppressed by donor doping.
The piezoelectric constant (d
Bi4Ti3-xWxO12+x +0.2wt%Cr2O3 | (°C) | at 100 kHz, | tan δ at 100 kHz, | d33(pC N-1) |
x=0.025 | 658 | 178 | 0.02 | 22 |
x=0.050 | 650 | 186 | 0.021 | 17 |
x=0.075 | 648 | 197 | 0.023 | 16 |
x=0.100 | 645 | 205 | 0.028 | 14 |
x=0.150 | 640 | 211 | 0.028 | 12 |
The crystallographic evolution and phase analysis of Bi4Ti3O12:W/Cr ceramics were determined by the XRD and the microstructural morphology was studied by SEM analysis. The modification of W/Cr significantly improved the piezoelectric activity of the Bi4Ti3O12:W/Cr ceramics. The Curie temperature decreased slightly with W/Cr modification increasing. Electrical relaxation mechanism was found to be similar for all the compositions. The excellent piezoelectric and dielectric properties coupled with high Curie temperature, demonstrated that the Bi4Ti2.975W0.025O12.025+0.2wt%Cr2O3 (x=0.025) ceramics are promising candidates for high temperature applications.
3. Nb/Ta modified Bi4Ti3O12 ceramics
Doped BIT is of interest in high-temperature piezoelectric sensors, because it remains ferroelectric at T > 600 °C and offers relatively high piezoelectric property (Kumar, 2001; Nagata, 1999; Noguchi, Sugibuchi, 1975; Shimakawa, 2000; Subbarao, 1961; 2000; Shulman, 2000; Shimazu, 1980). High leakage current and domain pinning due to defects in undoped BIT have appeared as obstacles for further applications. Unfortunately, the piezoelectric effect in high Curie temperature BIT is relatively low, with coefficient values less than 10 pC N-1 for pure BIT and less than 20 pC N-1 for modified Bi4Ti3O12. To improve the piezoelectric property, Nb/Ta co-modified BIT ceramics were fabricated by a conventional solid-state reaction process and the influence of the Nb2O5/Ta2O5 additive on the structure and electrical properties of the ceramics was investigated. The composition Bi4Ti3-2xNbxTaxO12 (BTNT, x=0, 0.01, 0.02, 0.04, 0.06) polycrystals were prepared by the conventional solid-state reaction technique.
To investigate the effect of Nb/Ta modified BIT ceramics on the phase stability, Bi4Ti3-2xNbxTaxO12 powders calcined at 800 °C for 4 h were prepared and their crystal structures were analyzed using XRD. Fig. 13 shows the XRD patterns of all samples. Diffraction data does not show any evidence of the formation of niobium and tantalum oxides or associated compounds that contain bismuth or titanium. This observation indicates that Nb/Ta ions in the BTNT ceramics do not form minority phase or segregate from the interior grain but dissolve into the perovskite lattice. Therefore, the BTNT ceramics maintains a layer structure similar to the perovskite BIT.
The microstructures of BTNT ceramics are shown in Fig. 14. As figure 14 show average grain size ranging from approximately 40 μm to 1μm in length decreased with increase of Nb/Ta amount, which suggested that the additive controlled the growth of the plate-like grains. The porosity was mainly located on grain boundaries. As is well known, both sintering and grain growth are closely associated with ion migration. Thus if the incorporation of Nb5+/Ta5+ into BIT led to an increase in the activating energy for ion migration, a reduction in the rate of grain growth would be expected with increasing amounts of Nb/Ta. Furthermore, according to the sintering theory, the particle surface energy and grain boundary energy are the major driving forces for sintering and grain growth.
BTNT ceramics sintered at the temperatures giving maximum density values were used for the measurement of dielectric property. Fig. 15 shows the permittivity, ε
A decrease of the oxygen vacancy after the Nb5+/Ta5+ doping results in the depression of the dielectric loss peak, which was consistent with previous reports (Shulman, 2000, 1996; Villegas, 1999). Thus B-site doping of equal valence can screen the effect of oxygen vacancy, which is contributing to an enhancement of the dielectric property of BTNT ceramics.
The selected room temperature properties of BTNT ceramics as a function of Nb/Ta amounts are characterized. Fig. 16c shows the permittivity and dielectric loss of the BTNT ceramics as a function of Nb/Ta amount. It was found that the room temperature permittivity of BTNT ceramics increased drastically whilst the dielectric loss decreased due to the depression of the oxygen vacancies with increasing Nb/Ta amounts. Figure 16a and 16b show the piezoelectric coefficient d
The B-site vacancies Bi4Ti3-2xNbxTaxO12 ceramics were synthesized by the solid-state reaction process. The analysis of the structure and the morphology were performed by XRD and FESEM. All the specimens maintained the orthorhombic structure and the addition of Nb2O5/Ta2O5 caused a remarkably suppressed grain growth, which plays the dominant role in the piezoelectric response. This work also presented the considerable influence of Nb2O5/Ta2O5 additive on the dielectric and piezoelectric properties. The Curie temperature, T
4. Nb/Ta/Sb modified Bi4Ti3O12 ceramics
Lead-based piezoelectric ceramics such as Pb(Zr,Ti)O3 (PZT), are widely used in piezoelectric actuators, sensors, and transducers due to their high relative permittivity, large remnant polarization, and excellent piezoelectric coefficients (Jaffe, 1971; Uchino, 2000). However, evaporation of toxic lead oxides during high temperature sintering produces environmental toxic burden and also generates instability of the composition and electrical properties of the ceramics. Thus, investigation of the possible use of ecologically clean lead-free ceramics in the field of science and technology is of great interest.
Bismuth titanate, Bi4Ti3O12 (BIT) is considered to be an excellent candidate as a key lead-free piezoelectric material owing to promising piezoelectric and ferroelectric properties. It is also a promising material for high temperature piezoelectric applications because of the high Curie temperature. However, as the spontaneous polarization movements are restricted to the a(b) plane of the unit cell (the c-axis component can be neglected), the ferroelectric and piezoelectric properties are much lower than those of PZT materials. It is likely, the piezoelectricity of pure BIT ceramics is low (d33 < 8 pC N-1), due to the fact that it has high electrical conductivity and high coercive field which impedes the poling process (Ahn, 2009; Hou, 2010; Shulman, 2000, 1996; Villegas, 2004). The piezoelectric properties can be enhanced by grain orientation techniques (Jones, 2005; Zhang, 2005). However, these processing methods such as hot forging or tape casting methods are not as cost effective as the production of ceramics via traditional powder pressing technologies. So, it is favourable to optimize piezoelectric properties via structural modification using appropriate doping. In this context, cations substitution to improve the piezoelectric properties of BIT have been considered and explored. It has been shown that the doping with donor cations such as Nb5+, W6+ or Ta5+ in the Ti4+ positions decreases electrical conductivity and improves piezoelectric properties of BIT ceramics (Azurmendi, 2006; Hou et al, 2010; Hong, 2000). We have reported that the value of d33 was 26 pC N-1 for Nb/Ta doped BIT ceramics, fabricated via the conventional solid state reaction route (Hou, 2009).
It is noted that the studies concerning the effect of Sb doped lead-free piezoelectric ceramics have been reported earlier, exhibiting high-performance piezoelectric and dielectric properties (Saito, 2004; Zhao, 2008; Zhang, 2010). However, reports on Sb-doped BIT ceramics are scarce. To further study the piezoelectric property, Sb2O3 has been considered for modifying Bi4Ti3-2xNbxTaxO12 (BTNT) ceramics via the conventional solid-state reaction route. The influence of the Sb2O3 additive on the structural, morphological, dielectric, electrical conductivity and piezoelectric properties of the ceramics is investigated in this work.
Fig. 17 shows XRD patterns of BTNTS powders calcined at 800 °C for 4 h. The XRD analysis of BTNTS ceramic powders revealed the presence of BTNTS phase. Therefore, the BTNTS ceramics in the Sb substituted structure can maintain a layer perovskite structure similar to the parent BIT perovskite.
The microstructures of BTNTS ceramics are shown in Fig. 18. The average grain size can be observed to be varying with the content of Sb2O3, suggesting that the additive controlled the growth of the plate-like grains of BTNTS. 8BTNTS ceramic has slight larger grains while there is a small variation in grain size for the other samples. Change in the microstructure with doping content is due to the reported formation of liquid phase (sillenite phase) which is generally observed during the synthesis of BIT (Rojero et al. 2010) (Although, this secondary phase was not detected in XRD due to small amounts (Fig. 17)). This liquid phase is increasing with the increase in Sb2O3 content and avail grain growth. 8BTNTS ceramic has larger grain size due to the presence of larger quantity of sillenite phase. However 10BTNTS ceramic samples were observed with smaller grains (Fig. 18(f)). It may be due to excess amount of antimony (after formation of solid solution) which reacted with sillenite phase and reduced it.
Fig. 19 shows the variation of the piezoelectric coefficient (d33) with respect to the content of Sb2O3 for the BTNTS ceramics. The value of d33 was found to be highest (35 pC N-1) for 8BTNTS ceramics. The d33 value is lower with deviation from 8BTNTS composition in both directions of increasing or decreasing the content of Sb2O3, but in all other compositions from 0 to 8, exceeds the hitherto maximum value of ~20 pC N-1. The d33 (35 pC N-1) of 8BTNTS is 337.5%, 84.2%, 75% and 34.6% higher than that of BIT (Shulman, 1996), W-doped BIT (Zhang, 2004), V-doped BIT (Tang, 2006), Nb-doped BIT (Shulman, 2000), Ta-doped BIT (Hong, 2000), and Nb/Ta-doped BIT (Hou et al, 2009). The thermal annealing behaviors for the 0BTNTS, 8BTNTS and 10BTNTS ceramics are shown in Fig. 20, where the piezoelectric coefficient, d33 are dependent on the annealing temperature. The d33 values of the BTNTS ceramics show no obvious drop, when the annealing temperature is lower than 500 °C. This indicates that BTNTS monoclinic structured materials are very stable to thermal annealing. When annealing temperature is higher than 500 °C, the piezoelectric coefficients of the 0BTNTS, 8BTNTS and 10BTNTS ceramics decrease sharply, and tend to zero when the annealing temperature is above Curie temperature (675 °C). No obvious degradation of the 0BTNTS, 8BTNTS and 10BTNTS ceramics is observed below 500 °C.
It is well known that the electrical properties are of fundamental importance for the piezoelectric applications. It is therefore worthwhile to investigate these properties over a moderately wide frequency and temperature range for 8BTNTS samples (highest d33 value among the Bi4Ti3O12–based ceramics). Fig. 21 shows the permittivity, ε
Fig. 23 depicts the frequency dependent (0.1 Hz~3 MHz) electrical conductivity for all the compositions at 600 °C. It is interesting to note that the electrical conductivity of 8BTNTS decreases significantly as compared with that of other ceramics. This difference in the value of electrical conductivity may be attributed to microscopic heterogeneity and random arrangement of cations in the structure due to Sb/Nb/Ta/Ti ions at B-site. We have reported that addition of Nb and Ta can directly introduce additional electrons for neutralizing the effect of p-type conductivity commonly observed in pure BIT (Shulman, 1996). These dopants also decrease the concentration of oxygen vacancy in the BIT doped by Nb/Ta. Sb has 3+ oxidation state in Sb2O3 (0.76 Å ionic radii) and can not be fitted on Ti4+ site (0.605 Å). However it is reported (Peiteado, 2006) that Sb3+ is unstable above 500 °C and completely transform into Sb5+ (0.60 Å ionic radii) in the presence of Bi2O3 oxide. It indicates that in the present study, Sb5+ ions are accommodated at Ti4+ sites since samples were sintered at 1100 °C. The amount of Sb added to the Nb/Ta doped BIT is in relatively small concentrations at the B-sites in the perovskite structure. In addition to the effect of reducing p-type conductivity, and decreasing oxygen vacancy concentration we can expect greater domain wall movement. Thus, Sb has the effect of controlling this switch to n-type conductivity while not impairing the decrease in p-type conductivity. In addition to donor effect of antimony, it is noticed that the microstructures of these samples are also doping dependent (Fig. 18). Scanning electron micrographs (Fig. 18) show that 8BTNTS ceramics have larger grain size than that of the other investigated samples. It is reported that microstructure plays for electrical properties of BIT ceramics (Jardiel, 2006). Due to the decrease in electrical conductivity, the polarization is aided, facilitating the improved piezoelectricity. The possible explanation may be ascribed to decrease in the concentration of oxygen vacancies that can diffuse to domain walls in the piezoelectric ceramic, resulting in lowering the pinning of the domain walls, thus increasing the number of available switching domain walls and resulting in the enhancement of d33 (Zhang, 2006).
In order to understand the conductivity mechanism in BTNTS ceramics, the ac conductivity plots that were obtained in the 300~600 °C temperature range for the 8BTNTS ceramics are shown in Fig. 24. The conductivity increases with increasing temperature due to thermal activation of conducting species in the samples. It exhibits two relaxations at different frequency region. The low frequency relaxation can be attributed to the grain boundary. As the frequency increases, the grain boundary resistance might become less than that of grain and grains dominate conductivity. The resistance and capacitance associated with grain and grain boundary interplay between their capacitive and dielectric contributions depending upon the frequency range. The high frequency conductivity is entirely due to the hopping of localized charge carriers. The bulk DC conductivity is difficult to ascertain from the above data (Fig. 24) because of significant contributions of grain boundary to the conductivity in low frequency regime.
The electric modulus approach was invoked to elucidate the electrical transport mechanism in 8BTNTS ceramics. The physical nature of the electric modulus (Macedo, 1972) is used to make a correlation between the conductivity and the relaxation of ions in these materials. This approach can effectively be employed to study bulk electrical behaviour of the moderately conducting samples. The complex electric modulus (M
where
It is seen from Fig. 25 (a) that at low frequencies,
The relaxation time associated with the process was determined from the plot of
where E
The electric modulus can be expressed as the Fourier transform of a relaxation function (t):
where the function (t) is the time evolution of the electric field within the materials and is usually taken as the Kohlrausch-Williams-Watts (KWW) function (Kohlrausch, 1954; Williams, 1970):
where τ
from Debye-type relaxation. When is close to zero, there exists a strong correlation between the hopping ions and its neighbouring ions. The was calculated at different temperatures using the electric modulus formalism. For the ideal Debye type relaxation, the full-width half maximum (FWHM) of imaginary part of electric modulus is 1.14 decades. Therefore, can be defined as 1.14/FWHM. One can estimate DC conductivity at different temperatures using the electrical relaxation data. The DC conductivity can be expressed as (Ngai, 1984):
where
where B is the pre-exponential factor and E
Fig. 29shows the frequency dependence plots of permittivity (ε’) and dielectric loss (tanδ) at various temperatures for 8BTNTS ceramics. It is evident that at all the temperatures (Fig. 29 (a)), the value of ε’ decreases with increasing frequency and attains a constant value. The high value of the dielectric constant in low-frequency regions is a extrinsic phenomenon arising due to the presence of metallic or blocking electrodes which do not permit the mobile ions to transfer into the external circuit, and as a result, mobile ions pile up near the electrodes and give a large bulk polarization in the materials as well as oxygen ion polarization at grain boundaries. When the temperature rises, the dispersion region shifts towards higher frequencies and the nature of the dispersion changes at low frequencies due to the electrode polarization along with grain boundary effects. A plateau region at 500 °C was observed at moderately low frequencies that shifted to higher frequencies with increase in temperature (600 °C). This plateau region distinguished electrode polarizations to the grain boundary polarizations. The variation in the tanδ with the temperature at various frequencies (Fig. 29 (b)) is consistent with that of the dielectric behaviour. The loss decreases with increase in frequency at different temperatures (300-600 °C). It is also observed that the dielectric loss increases with increase in temperature which is attributed to the increase in conductivity of the ceramics due to thermal activation of conducting species. The clear relaxation peak was not encountered at any temperature under study because of dominant DC conduction losses due to high oxygen ion mobility in the temperature range under study.
5. Conclusions
We have reported the effects of composition and crystal lattice structure upon microstructure, dielectric, piezoelectric and electrical properties of BIT, Bi4Ti3-xWxO12+x+0.2wt%Cr2O3 (BTWC), Bi4Ti3-2xNbxTaxO12 (BTNT) and Bi4Ti3-2xNbxTax-ySbyO12 (BTNTS) ceramics. WE have shown how doping can increase the piezoelectric coefficient of BIT. For the W/Cr samples, a d
References
- 1.
Aurivillius B. 1949 Mixed Bismuth Oxides with Layer Lattices: I. Structure Type of CaBi2B2O9.1 54 463 480 . - 2.
Ahn C. Jeong E. Kim Y. et al. 2009 Piezoelectric Properties of Textured Bi3. 25La0. 75Ti2. 970 03O12 Ceramics Fabricated by Reactive Templated Grain Growth Method. J. Electroceramics, 23,392 EOF 396 EOF . - 3.
Azurmendi N. Caro I. Caballero A. et al. 2006 Microwave-Assisted Reaction Sintering of Bismuth Titanate-Based Ceramics .., 89,1232 EOF 1236 EOF . - 4.
Armstrong R. Newnham E. 1972 Bismuth titanate solid solutions . 7,1025 EOF 1034 EOF . - 5.
Bergman R. 2000 General Susceptibility Functions for Relaxations in Disordered Systems. 88, 1356. 179. - 6.
Coondoo I. Jha A. Agarwal S. 2007 Enhancement of dielectric characteristics in donor doped Aurivillius SrBi2Ta2O9 ferroelectric ceramics . 27,253 EOF 260 EOF . - 7.
Du H. Tang L. Kaskel S. 2009 Preparation, Microstructure, and Ferroelectric Properties of Bi3.25La0.75Ti3−xMxO12 (M = Mo, W, Nb, V) Ceramics., 113, 1329. - 8.
Ehara S. Muramatsu K. Shimazu M. et al. 1981 Dielectric Properties of Bi4Ti3O12 Below the Curie Temperature.., 20, 877. - 9.
Fouskova A. Cross L. 1970 Dielectric Properties of Bismuth Titanate. 41, 2834. - 10.
Hong S. Horn J. Mc Kinstry S. et al. 2000 Dielectric and Ferroelectric Properties of Ta-doped Bismuth Titanate . J. Mater. Sci. Lett., 19,1661 EOF 1664 EOF . - 11.
Hong S. Horn J. Mc Kinstry S. et al. 2000 Dielectric and Ferroelectric Properties of Ta-doped Bismuth Titanate . , 19,1661 EOF 1664 EOF . - 12.
Hou J. Qu Y. Rahul V. Krsmanovic D. Kumar R. V. 2010 Crystallographic Evolution, Dielectric and Piezoelectric Properties of Bi4Ti3O12:W/Cr Ceramics. 93, 1414. - 13.
Hou J. Kumar R. V. Qu Y. Krsmanovic D. 2009 B-site Doping Effect on Piezoelectric Property of Bi4Ti3 2 xNbxTaxO12 Ceramics. , 61, 664. - 14.
Hou J. Rahul V. Qu Kumar. R. V. 2010 Dielectric and Pyroelectric Properties of Bi4Ti2.98Nb0.01Ta0.01O12 Ceramics. 121, 32. - 15.
Hou J. Kumar R. V. Qu Y. Krsmanovic D. Controlled synthesis of photoluminescent Bi4Ti3O12 nanoparticles from metal-organic polymeric precursor . J. Nanopart. Res.,2010 12,563 EOF 571 EOF . - 16.
Hou J. Kumar R. V. Qu Y. Krsmanovic D. Controlled synthesis of photoluminescent Bi4Ti3O12 nanoparticles from metal-organic polymeric precursor . J. Nanopart. Res.,2010 12,563 EOF 571 EOF . - 17.
Hong S. Mc Kinstry S. Messing G. 2000 Dielectric and Electromechanical Properties of Textured Niobium Doped Bismuth Titanate Ceramics . 83,113 EOF 118 EOF . - 18.
Hou Y. Lu P. Zhu M. et al. 2005 Effect of Cr2O3 Addition on the Structure and Electrical Properties of Pb((Zn1/3Nb2/3)0.20(Zr0.50Ti0.50)0.80)O3 Ceramics. 116, 104. - 19.
Hyatt N. Reaney I. . Knight K. 2005 Ferroelectric-Paraelectric Phase Transition in the n = 2 Aurivillius Phase Bi3Ti1.5W0.5O9: A Neutron Powder Diffraction Stu dy., 71, 241191. - 20.
Jardiel T. Caballero A. Villegas M. 2006 Sintering Kinetic of Bi4Ti3O12 based Ceramics. Bol. Soc. Esp. Ceram.45 202. - 21.
Jardiel T. Rubia M. Peiteado M. 2008 Control of Functional Microstructure in WO3 -doped Bi4Ti3O12 Ceramcis. 91, 1083. - 22.
Jardiel T. Villegas M. Caballero A. et al. 2008 Solid-State Compatibility in the System Bi2O3 -TiO2-Bi2WO6. J. Am. Ceram. Soc., 91, 278. - 23.
Jardiel T. Caballero A. Frutos J. Villegas M. 2006 Sintering and Electrical Properties of Bi6Ti3WO18 Ceramics . 336,145 EOF 152 EOF . - 24.
Jonscher A. 1977 The ‘Universal’ Dielectric Response., 267, 673. - 25.
Jaffe B. 1971 Piezoelectric Ceramics India. Chap. 7. - 26.
Jones J. Slamovich E. Bowman K. et al. 2005 Domain Switching Anisotropy in Textured Bismuth Titanate Ceramics . 98,104102 EOF . - 27.
Kohlrausch R. 1954 Theorie Des Elektrischen Rückstandes in Der Leidner Flasche. 91, - 28.
Li J. Sun Q. 2008 Effects of Cr2O3 Doping on the Electrical Properties and the Temperature Stabilities of PZT Binary Piezoelectric Ceramics. , 27, 362 EOF 366 EOF . - 29.
Kumar M. Ye Z. 2001 Dielectric and electric properties of the donor- and acceptor- doped ferroelectric SrBi2 Ta2O9. 90,934 EOF . - 30.
Kan Y. Jin X. Zhang G. et al. 2004 Lanthanum Modified Bismuth Titanate Prepared by a Hydrolysis Method . , 14, 3566. - 31.
Lopatin S. 1989 Translated from Izvestiya Akademii Nauk SSSR, Neorganicheskie Materialy 24, 1551. - 32.
Luo S. Noguchi Y. Miyayama M. Kudo T. 2001 Rietveld Analysis and Dielectric Properties of Bi2WO .., 36, 531.6 -Bi4Ti3O12 Ferroelectric System - 33.
Luo S. Noguchi Y. Miyayama M. Kudo T. 2001 Rietveld Analysis and Dielectric Properties of Bi2WO . ., 36, 531.6 -Bi4Ti3O12 Ferroelectric System - 34.
Macedo P. Moynihan C. Bose R. 1972 Role of Ionic Diffusion in Polarization in Vitreous Ionic Conductors. P, 13, 171. - 35.
Markovec D. Pribošic I. Samardžija Z. Drofenik M. 2001 Incorporation of Aliovalent Dopants into the Bismuth-Layered Perovskite-Like Structure of BaBi4Ti4O15. 84, 2702. - 36.
Noguchi Y. Miwa I. Goshima Y. et al. 2000 Oxygen-vacancy-induced 90°-domain clamping in ferroelectric Bi4Ti3O12 single crystals. 39, L1259. - 37.
Nagata H. 2004 Ceramic Transactions. Ceramic Materials and Multilayer Electronic Devices.., 150. - 38.
Nagata H. Chikushi N. Takenaka T. 1999 Piezoelectric Properties of Bismuth Layer-Structured Ferroelectric Ceramics with Sr-Bi-Ti-Ta System . 38, 5497. - 39.
Ngai K. Rendell R. Jain H. 1984 Anomalous Isotope-mass Effect in Lithium Borate Glasses: Comparison with a Unified Relaxation Model . , 30,2133 EOF 2139 EOF . - 40.
Peiteado M. Rubia M. Fernandez J. et al. 2006 Thermal Evolution of ZnO-Bi2O3 -Sb2O3 System in the Region of Interest for Varistor. 41, 2319. - 41.
Rojero M. Romero J. Marcos F. et al. 2010 Intermediate Phases Formation During the Synthesis of Bi4Ti3O12 by Solid State Reaction. Ceram. Int., 36,1319 EOF 1325 EOF . - 42.
Shulman H. Damjanovic D. Setter N. 2000 Niobium Doping and Dielectric Anomalies in Bismuth - 43.
Titanate J. Am Ceram. Soc 83528 528. - 44.
Shulman H. Testorf M. Damjanovic D. Setter N. 1996 Microstructure, Electrical Conductivity, and Piezoelectric Properties of Bismuth Titanate . J. Am. Ceram. Soc. 79, 3124. - 45.
Shimazu M. Tanaka J. Muramatsu K. et al. 1980 Phase transition in the family LaxBi4−xTi3O12: In relation to lattice symmetry and distortion. 35, 402. - 46.
Sugibuchi K. Kurogi Y. Endo N. 1975 Ferroelectric field-effect memory device using Bi4Ti3O12 film. 47, 2877. - 47.
Snyder R. Fiala J. . Bunge J. 1999 Defect and Microstructure Analysis by Diffraction . International Union of Crystallography, Oxford Science Publication, Oxford. - 48.
Subbarao E. 1961 Ferroelectricity in Bi4Ti3O12 and Its Solid Solutions. 122, 804. - 49.
Saito Y. Takao H. Tani T. et al. 2004 Lead-free piezoceramics. , 432, 84. - 50.
Shimakawa Y. Kubo Y. Tauchi Y. et al. 2000 Structural distortion and ferroelectric properties of SrBi2(Ta1−xNbx)2O9. Appl. Phys. Lett. 77, 2749. - 51.
Takahashi M. Noguchi Y. Miyayama M. 2003 Effects of V-Doping on Mixed Conduction Properties of Bismuth Titanate Single Crystals .., 42,6222 EOF 6225 EOF . - 52.
Takahashi M. Noguchi Y. Miyayama M. 2004 Estimation of Ionic and Hole Conductivity in - 53.
Bismuth Titanate Polycrystals at High Temperatures. ,172 325. - 54.
Takahashi M. 1970 Space Charge Effect in Lead Zirconate Titanate Ceramics Caused by the Addition of Impurities .., 9,1236 EOF 1246 EOF . - 55.
Tang Q. Kan Y. Li Y. et al. 2006 Effect of Vanadium Doping on Fabrication and Property of Bi4Ti3O12 Ceramics . , 54,2075 EOF . - 56.
Tang Q. Kan Y. Li Y. et al. 2007 Ferroelectric and Dielectric Properties of Nd/V Co-doped Bi4Ti3O12 Ceramics .1 EOF 5 EOF 42, 1. - 57.
Takenaka T. Sakata K. 1981 Electrical properties of grain-oriented ferroelectric ceramics in some lanthanum modified layer-structure oxides . . 38,769 EOF 772 EOF . - 58.
Uchino K. 2000 Ferroelectric Devices , New York. Chap. 7. - 59.
Villegas M. Caballero A. Moure C. et al. 1999 Factors Affecting the Electrical Conductivity of Donor-Doped Bi4Ti3O12 Piezoelectric Ceramics . 82,2411 EOF 2416 EOF . - 60.
Villegas M. Caballero A. Moure C. et al. 1999 Low-temperature sintering and electrical properties of chemically W-doped Bi4Ti3O12 ceramics . 19,1183 EOF 1186 EOF . - 61.
Villegas M. Jardiel T. Farias G. 2004 Sintering and Electrical Properties of Bi4Ti2.95WxO11.9+3x piezoelectric ceramics. 24, 1025. - 62.
Vaish R. Varma K. 2009 Dielectric Properties of Li2O-3B2O3 Glasses. J. Appl. Phys., 106, 064106. - 63.
Vaish R. Varma K. 2009 Low Loss and Frequency (1 kHz-1 MHz) Independent Dielectric Characteristics of 3BaO-3TiO 106, 114109.2 -B2O3 Glasses. - 64.
Williams G. Watts D. 1970 Non-Symmetrical Dielectric Relaxation Behaviour Arising from a Simple Empirical Decay Function . ., 66,80 EOF 85 EOF . - 65.
Yang Z. Zhang R. Yang L. et al. 2007 Effects of Cr2O3 Doping on the Electrical Properties and the Temperature Stabilities of PNW-PMN-PZT Ceramics .., 42,2156 EOF . - 66.
Zhang H. Yan H. Reece M. 2009 The Effect of Nd Substitution on the Electrical Properties of Bi3NbTiO9 Aurivillius Phase Ceramics. , 106, 044106. - 67.
Zhao P. Zhang B. 2008 High Piezoelectric d33 Coefficient in Li/Ta/Sb-Codoped Lead-Free (Na,K)NbO3 Ceramics Sintered at Optimal Temperature. J. Am. Ceram. Soc., 91,3078 EOF 3081 EOF . - 68.
Zhang L. Zhao S. Yu H. et al. 2004 Microstructure and Electrical Properties of Tungsten-Doped Bismuth Titanate Ceramics ., 43,7613 EOF 7617 EOF . - 69.
Zhang L. Chu R. Zhao S. et al. 2005 Microstructure and Electrical Properties of Niobium Doped Bi4Ti3O12 Layer-structured Piezoelectric Ceramics . , 116,99 EOF 103 EOF . - 70.
Zhou Z. Dong X. Yan H. et al. 2006 Doping Effects on the Electrical Condcutivity of Bismuth Layered Bi3TiNbO9 -based Ceramics.., 100, 044112. - 71.
Zhang Q. Zhang B. Li H. et al. 2010 Effects of Sb content on electrical properties of lead-free piezoelectric [(Na0.535K0.480)0.942Li0.058](Nb1−xSbx)O3 ceramics ., 490, 260.