Open access peer-reviewed chapter

Measurement of Production Efficiency in Semiconductor Assembly House: Approach of Data Envelopment Analysis

By Chien-wen Shen, Ming-Jen Cheng and Ming-Chia Chi

Published: October 1st 2009

DOI: 10.5772/7748

Downloaded: 2410

© 2009 The Author(s). Licensee IntechOpen. This chapter is distributed under the terms of the Creative Commons Attribution-NonCommercial-ShareAlike-3.0 License, which permits use, distribution and reproduction for non-commercial purposes, provided the original is properly cited and derivative works building on this content are distributed under the same license.

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Chien-wen Shen, Ming-Jen Cheng and Ming-Chia Chi (October 1st 2009). Measurement of Production Efficiency in Semiconductor Assembly House: Approach of Data Envelopment Analysis, Engineering the Computer Science and IT Safeeullah Soomro, IntechOpen, DOI: 10.5772/7748. Available from:

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