Open access peer-reviewed Edited Volume
Thin Film Processes - Artifacts on Surface Phenomena and Technological Facets
View Chapters
Share
Cite
Academic Editor
SASTRA Deemed University, Thanjavur, India,
India
Table of Contents
Open access chapters
By Jagannathan Thirumalai
2,920By Armando Gregorio Rojas Hernández and S. Jesus Castillo
2,395
By Irzaman, Heriyanto Syafutra, Ridwan Siskandar, Aminullah and Husin Alatas
2,054By Tetyana V. Torchynska and Brahim El Filali
1,664By Andre Slonopas, Nibir K. Dhar, Herbert Ryan, Jerome P. Ferrance, Pamela Norris and Ashok K. Sood
1,414By Vanessa Rheinheimer and Ignasi Casanova
1,824By Sarkyt Kudaibergenov, Gulnur Tatykhanova, Nurlan Bakranov and Rosa Tursunova
2,480By Helena Castán, Salvador Dueñas, Alberto Sardiña, Héctor García, Tõnis Arroval, Aile Tamm, Taivo Jõgiaas, Kaupo Kukli and Jaan Aarik
1,595By Stephan Vladymirov Kozhukharov
1,918IMPACT OF THIS BOOK AND ITS CHAPTERS
19,719 Total Chapter Downloads
4,126 Total Chapter Views
17 Crossref Citations
10 Web of Science Citations
30 Dimensions Citations
1 Altmetric Score
Order a print copy of this book
Available on
Delivered by
£119 (ex. VAT)*
Hardcover | Printed Full Colour
IntechOpen Contributor? Get your Discount
FREE SHIPPING WORLDWIDE
Order & Delivery info* Residents of European Union countries need to add a Book Value-Added Tax Rate based on their country of residence. Institutions and companies, registered as VAT taxable entities in their own EU member state, will not pay VAT by providing IntechOpen with their VAT registration number. This is made possible by the EU reverse charge method.
Instructor? Request an Exam CopyRelated books
