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Lifetime Yield Optimization of Analog Circuits Considering Process Variations and Parameter Degradations

Written By

Xin Pan and Helmut Graeb

Submitted: 21 May 2010 Published: 02 February 2011

DOI: 10.5772/14322

From the Edited Volume

Advances in Analog Circuits

Edited by Esteban Tlelo-Cuautle

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Written By

Xin Pan and Helmut Graeb

Submitted: 21 May 2010 Published: 02 February 2011