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Quality Model based on Object-oriented Metrics and Naive Bayes

Written By

Sai Peck Lee and Chuan Ho Loh

Submitted: 17 May 2010 Published: 21 January 2011

DOI: 10.5772/14047

From the Edited Volume

New Fundamental Technologies in Data Mining

Edited by Kimito Funatsu

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Written By

Sai Peck Lee and Chuan Ho Loh

Submitted: 17 May 2010 Published: 21 January 2011