Open access peer-reviewed chapter

Nanoscale Effects of Friction, Adhesion and Electrical Conduction in AFM Experiments

By Marius Enachescu

Submitted: May 7th 2011Reviewed: December 4th 2011Published: March 23rd 2012

DOI: 10.5772/35033

Downloaded: 2123

© 2012 The Author(s). Licensee IntechOpen. This chapter is distributed under the terms of the Creative Commons Attribution 3.0 License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

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Marius Enachescu (March 23rd 2012). Nanoscale Effects of Friction, Adhesion and Electrical Conduction in AFM Experiments, Atomic Force Microscopy - Imaging, Measuring and Manipulating Surfaces at the Atomic Scale, Victor Bellitto, IntechOpen, DOI: 10.5772/35033. Available from:

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