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Nanoscale Effects of Friction, Adhesion and Electrical Conduction in AFM Experiments

Written By

Marius Enachescu

Submitted: 07 May 2011 Published: 23 March 2012

DOI: 10.5772/35033

From the Edited Volume

Atomic Force Microscopy - Imaging, Measuring and Manipulating Surfaces at the Atomic Scale

Edited by Victor Bellitto

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Written By

Marius Enachescu

Submitted: 07 May 2011 Published: 23 March 2012