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Measurement of the Nanoscale Roughness by Atomic Force Microscopy: Basic Principles and Applications

By R.R.L. De Oliveira, D.A.C. Albuquerque, T.G.S. Cruz, F.M. Yamaji and F.L. Leite

Submitted: June 6th 2011Reviewed: January 13th 2012Published: March 23rd 2012

DOI: 10.5772/37583

Downloaded: 18919

© 2012 The Author(s). Licensee IntechOpen. This chapter is distributed under the terms of the Creative Commons Attribution 3.0 License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

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R.R.L. De Oliveira, D.A.C. Albuquerque, T.G.S. Cruz, F.M. Yamaji and F.L. Leite (March 23rd 2012). Measurement of the Nanoscale Roughness by Atomic Force Microscopy: Basic Principles and Applications, Atomic Force Microscopy Victor Bellitto, IntechOpen, DOI: 10.5772/37583. Available from:

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