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Chemistry » Electrochemistry » "Atomic Force Microscopy - Imaging, Measuring and Manipulating Surfaces at the Atomic Scale", book edited by Victor Bellitto, ISBN 978-953-51-0414-8, Published: March 23, 2012 under CC BY 3.0 license. © The Author(s).

Chapter 9

AFM Application in III-Nitride Materials and Devices

By Z. Chen, L.W. Su, J.Y. Shi, X.L. Wang, C.L. Tang and P. Gao
DOI: 10.5772/37527