Open access peer-reviewed chapter

In-Situ Supply-Noise Measurement in LSIs with Millivolt Accuracy and Nanosecond-Order Time Resolution

By Yusuke Kanno

Submitted: February 22nd 2011Reviewed: July 23rd 2011Published: November 23rd 2011

DOI: 10.5772/27833

Downloaded: 2017

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Yusuke Kanno (November 23rd 2011). In-Situ Supply-Noise Measurement in LSIs with Millivolt Accuracy and Nanosecond-Order Time Resolution, Applications of Digital Signal Processing Christian Cuadrado-Laborde, IntechOpen, DOI: 10.5772/27833. Available from:

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