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Microscopy and Spectroscopy Analysis of Mems Corrosion Used in the Electronics Industry of the Baja California Region, Mexico

By Gustavo Lopez Badilla, Benjamin Valdez Salas, Michael Schorr Wiener and Carlos Raúl Navarro González

Submitted: December 7th 2011Reviewed: March 27th 2012Published: July 26th 2012

DOI: 10.5772/45773

Downloaded: 1823

© 2012 The Author(s). Licensee IntechOpen. This chapter is distributed under the terms of the Creative Commons Attribution 3.0 License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

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Gustavo Lopez Badilla, Benjamin Valdez Salas, Michael Schorr Wiener and Carlos Raúl Navarro González (July 26th 2012). Microscopy and Spectroscopy Analysis of Mems Corrosion Used in the Electronics Industry of the Baja California Region, Mexico, Air Quality Gustavo Lopez Badilla, Benjamin Valdez and Michael Schorr, IntechOpen, DOI: 10.5772/45773. Available from:

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