Open access peer-reviewed chapter

Confocal White Light Reflection Imaging for Characterization of Nanostructures

By C. L. Du, Y. M. You, Z. H. Ni, J. Kasim and Z. X. Shen

Submitted: February 21st 2011Reviewed: July 5th 2011Published: March 21st 2012

DOI: 10.5772/27636

Downloaded: 1798

© 2012 The Author(s). Licensee IntechOpen. This chapter is distributed under the terms of the Creative Commons Attribution 3.0 License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

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C. L. Du, Y. M. You, Z. H. Ni, J. Kasim and Z. X. Shen (March 21st 2012). Confocal White Light Reflection Imaging for Characterization of Nanostructures, Advanced Photonic Sciences Mohamed Fadhali, IntechOpen, DOI: 10.5772/27636. Available from:

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